Affa-X RS TEC-Cooled Back-Thinned CCD Raman Spectrometer

The Affa-X RS is a premium back-thinned Raman spectrometer designed for high-sensitivity, low-noise, and highly reproducible Raman measurements in advanced laboratory environments.

Built on Thunder Optics’ upgraded ORT2 platform, the Affa-X RS integrates a cooled Hamamatsu S16011 back-thinned CCD detector, providing enhanced quantum efficiency, improved weak-signal detection, and excellent long-integration stability.

Compared with the standard Affa RS platform, the Affa-X RS is designed for users who require higher sensitivity, improved low-light performance, and more demanding Raman acquisition capability.

By combining active detector cooling, stabilized laser excitation, precision optical alignment, and an optimized Raman optical path, the system enables reliable acquisition of weak Raman signals while maintaining long-term spectral stability.

The Affa-X RS is designed for academic research, materials characterization, chemistry, nanotechnology, gemology, pharmaceutical research, and laboratory-based analytical applications requiring consistent and quantitative Raman performance.

The Affa-X RS is Thunder Optics’ premium TEC-cooled Raman spectrometer, engineered for high-sensitivity, low-noise, and highly reproducible Raman measurements in advanced laboratory environments.

Built on Thunder Optics’ upgraded ORT2 platform, the Affa-X RS integrates a cooled Hamamatsu S16011 back-thinned CCD detector, providing enhanced quantum efficiency, improved weak-signal detection, and excellent long-integration stability.

As a premium back-thinned Raman spectrometer, the Affa-X RS is optimized for weak-signal detection and stable long-integration measurements.

Compared with the standard Affa RS platform, the Affa-X RS is designed for users who require higher sensitivity, improved low-light performance, and more demanding Raman acquisition capability.

Advanced Back-Thinned CCD Detector and Active Cooling

The Affa-X RS is built on Thunder Optics’ upgraded ORT2 spectrometer platform and integrates a cooled Hamamatsu S16011 back-thinned CCD detector.

Back-thinned CCD technology provides improved sensitivity compared with standard front-illuminated detector architectures, especially when weak Raman signals must be detected with high stability.

This back-thinned Raman spectrometer architecture is particularly useful when Raman signals are weak or when long acquisition times are required.

The detector is actively temperature-stabilized by a Thermo-Electric Cooling system, reducing dark current and thermal noise during demanding Raman measurements.

This ensures:

• Enhanced detection of weak Raman signals
• Improved low-light sensitivity
• Stable long integration times
• High signal-to-noise performance
• Reproducible measurements over extended acquisition sessions
• Better stability for advanced laboratory Raman analysis

This architecture makes the Affa-X RS particularly suitable for demanding Raman measurements where sensitivity, stability, and reproducibility are critical.

Back-Thinned Raman Spectrometer Performance

Interchangeable Slit System

The Affa-X RS includes an interchangeable slit architecture, allowing users to adapt the spectrometer to different Raman measurement priorities.

Each Affa-X RS system is supplied as standard with a 50 µm slit, providing a balanced compromise between signal throughput and spectral resolution. With the standard 50 µm slit, the typical Raman spectral resolution is approximately 11 cm⁻¹.

Optional slit widths are available for users who need to optimize the system for specific applications:

• 25 µm slit — recommended when higher spectral resolution is required. Typical Raman resolution: approximately 6 cm⁻¹.
• 100 µm slit — recommended when higher signal throughput is more important than maximum resolution.
• 200 µm slit — available for very low-light applications where maximum optical throughput is required.

This modular slit system allows the Affa-X RS to be configured for high-resolution Raman analysis, standard laboratory measurements, or weak-signal applications.

Advanced Back-Thinned Raman Spectrometer Architecture

The optical path of the Affa-X RS is optimized to minimize stray light, preserve spectral accuracy, and improve the acquisition of weak Raman signals.

Carefully aligned components and a stabilized excitation path provide:

• High spectral sensitivity
• Reduced background interference
• Stable peak positioning
• Consistent measurement reproducibility
• Improved weak-signal performance

This architecture supports demanding research applications in materials science, chemistry, nanotechnology, gemology, and advanced laboratory environments.

Configurable Excitation Options

The Affa-X RS is available with 532 nm or 785 nm laser excitation, allowing the system to be adapted to different sample types and Raman applications.

532 nm excitation is recommended when high Raman scattering efficiency is required. It is suitable for many minerals, inorganic materials, semiconductors, carbon materials, and strong Raman scatterers.

785 nm excitation is recommended when fluorescence reduction is important. It is particularly useful for many organic, biological, colored, or fluorescence-prone samples.

This flexibility allows the Affa-X RS to be configured for a wide range of research, analytical, educational, and industrial Raman measurements.

Laser Excitation and Power Control

The Affa-X RS uses high-stability, narrow-linewidth, fiber-coupled laser sources designed for Raman spectroscopy. Both excitation options are selected for stable operation, reproducible coupling into the Raman probe, and controlled optical power delivery during demanding measurements.

532 nm Laser Configuration

The 532 nm configuration uses a high-stability CW solid-state green laser source with narrow spectral linewidth and fiber-coupled SMA905 output.

Wavelength: 532 nm
Spectral linewidth: <0.1 nm
Output power: >200 mW after fiber
Power stability: <2% over 4 hours
Power control: fine adjustable laser power
Power adjustment: 1 mW step available
Fiber coupling: 200 µm optical fiber, 1 m length, SMA905 connectors

785 nm Laser Configuration

The 785 nm configuration is recommended for samples where fluorescence reduction is required.

Wavelength: 785 nm
Spectral linewidth: 0.1 nm
Output power: up to 500 mW
Power control: 0–100% adjustable output power
Power stability: ±2% over 4 hours, typical
Wavelength stability: ±7 pm over 4 hours, typical
Connector: SMA905 / FC-PC compatible fiber-coupled output
Laser safety level: Class 3B

Adjustable laser power allows users to optimize Raman signal intensity while reducing the risk of sample heating, fluorescence increase, or optical damage on sensitive materials.

Performance Highlights

• Premium upgraded ORT2 cooled Raman platform
• Hamamatsu S16011 back-thinned cooled CCD detector
• Enhanced quantum efficiency and weak-signal sensitivity
• Interchangeable slit system
• Standard 50 µm slit included
• Typical resolution: ~11 cm⁻¹ with 50 µm slit
• Optional 25 µm slit for higher resolution: ~6 cm⁻¹
• Optional 100 µm and 200 µm slits for higher signal throughput
• 532 nm or 785 nm laser excitation
• High-stability 532 nm laser with <2% power stability over 4 hours
• 785 nm laser power up to 500 mW with 0–100% power adjustment
• Spectral accuracy ±1–3 cm⁻¹
• Designed for stable long-integration Raman measurements
• Optimized for demanding weak-signal Raman applications

System Integration

The Affa-X RS integrates seamlessly with Thunder Optics Raman probes, fiber-coupled spectroscopy accessories, laboratory sample holders, calibration standards, and ThunderView software.

It is fully compatible with Thunder Optics spectroscopy solutions, enabling flexible laboratory configurations and advanced Raman workflows.

ThunderView software provides acquisition control, adjustable integration time, averaging, smoothing, baseline correction, spectral visualization, database creation, reference spectrum import, and Raman identification tools.

Research Applications

Materials Science

Carbon materials, semiconductors, nanomaterials, thin films

Chemistry

Molecular identification, phase analysis, structural characterization

Pharmaceutical Research

Compound verification, polymorphism studies, formulation analysis

Gemology and Mineral Identification

Gemstone identification, mineral characterization, inclusion analysis

Academic Research

Advanced spectroscopy training and laboratory education

The Affa-X RS delivers premium Raman performance for users who require enhanced sensitivity, stable long integrations, and reliable weak-signal detection in advanced research and laboratory environments.

For advanced laboratories, the Affa-X RS provides a back-thinned Raman spectrometer solution focused on sensitivity, stability, and reproducible Raman performance.