TECHNICAL RESOURCES
Thunder Optics Technical Notes
Technical notes presenting measured instrument performance, characterization methods, experimental observations and practical spectroscopy considerations based on Thunder Optics instrumentation.
LATEST TECHNICAL NOTES
Measured Performance & Instrument Characterization
TN-001 · RAMAN SPECTROSCOPY
Temporal Dark Noise Characterization of the ORT2-X Raman Spectrometer
Detector noise characterization from 50 ms to 10 s integration time using raw dark acquisitions, with emphasis on short-exposure Raman measurements.
Instrument: ORT2-X Raman Spectrometer
TN-002 · RAMAN EXCITATION
Repeatability of a 532 nm Raman Excitation Chain
Repeatability and power-step response of the RM-T-X 532 high-stability, TEC-cooled excitation chain, verified through silicon Raman measurements.
Laser: RM-T-X 532 · Raman reference: Silicon